Defects in high-k gate dielectric stacks : nano-electronic semiconductor devices/ edited by Evgeni Gusev..

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NATO Advanced Research Workshop on Defects in High-K Dielectric Nano-electronic Semiconductor Devices (2005 : Saint Petersburg, Russia)

Language: English Series: NATO science series | Series II, Mathematics, physics and chemistry ; v. | 220Publisher: Dordrecht : Springer, c2006 2006Description: x, 492 p. : ill. ; 25 cmContent type:

metin

Media type:

aracısız

Carrier type:

cilt

ISBN:

1402043651
1402043678
9781402043659

Subject(s):

LOC classification:

ML2006 .D44 2006

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Holdings
Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	Book	Prof. Dr. Azmi Özcan Kütüphanesi			Uluğbey Salonu	ML2006 .D44 2006 (Browse shelf(Opens below))	ML				Available	Genel Bağış		0028980

"Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-k Dielectric Nano-electronic Semiconductor Devices, held July 11-14, 2005, in St. Petersburg, Russia."--Colophon.

Includes bibliographical references and indexes.

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