000 01665nam a22004097a 4500
008 110330b2006 no a|||gr||||#||||0|eng |
040 _aTR-BiSEU
_btur
_cTR-BiSEU
_erda
001 0028980
003 KOHA_MİRAKIL
005 20260207002646.0
007 ta
020 _a1402043651
_q(hd.bd.)
020 _a1402043678
_q(e-book)
020 _a9781402043659
_q
_c14
041 0 _aeng
044 _cno
050 _aML2006
_b.D44 2006
111 2 _aNATO Advanced Research Workshop on Defects in High-K Dielectric Nano-electronic Semiconductor Devices (2005 : Saint Petersburg, Russia)
_957381
245 1 _aDefects in high-k gate dielectric stacks :
_bnano-electronic semiconductor devices/
_cedited by Evgeni Gusev..
264 1 _aDordrecht :
_bSpringer, c2006
_c2006
300 _ax, 492 p. :
_bill. ;
_c25 cm.
336 _ametin
_btxt
_2rdacontent
337 _aaracısız
_bn
_2rdamedia
338 _acilt
_bnc
_2rdacarrier
490 1 _aSeries II, Mathematics, physics and chemistry ;
_vv.
490 1 _a220
490 1 _aNATO science series.
500 _a"Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-k Dielectric Nano-electronic Semiconductor Devices, held July 11-14, 2005, in St. Petersburg, Russia."--Colophon.
500 _aIncludes bibliographical references and indexes.
650 0 _aGate array circuits--Congresses.
_957382
650 0 _aDielectrics--Congresses.
_957383
650 0 _aSemiconductors--Defects--Congresses.
_957384
830 1 _aNATO science series.
_932495
830 1 _aSeries II, Mathematics, physics and chemistry ;
_vv.
_957385
830 1 _a220
_943676
942 _2lcc
_cBK
999 _c28902
_d28902