Defects in high-k gate dielectric stacks :  nano-electronic semiconductor devices/ 
edited by Evgeni Gusev.. 
 - x, 492 p. :  ill. ;  25 cm. 
 - Series II, Mathematics, physics and chemistry ;  v. 220  NATO science series. .
 - NATO science series. Series II, Mathematics, physics and chemistry ;  v. 220  .
<br/><br/> "Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-k Dielectric Nano-electronic Semiconductor Devices, held July 11-14, 2005, in St. Petersburg, Russia."--Colophon.   Includes bibliographical references and indexes. 
<br/><br/><label>ISBN: </label>1402043651 1402043678 9781402043659  14 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Gate array circuits--Congresses. <br/>Dielectrics--Congresses. <br/>Semiconductors--Defects--Congresses. 
<br/><br/><label>LC Class. No.: </label>ML2006  / .D44 2006